 | ||
Multi-layered graphene sample | ||
 | Graphene monolayer, bilayer and other multiple-layer regions identified StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake Map area: 110 µm x 120 µm Spectra generated: 40,000 Acquisition time: 14 minutes | |
CVD diamond film | ||
 | Polished surface of polycrystalline diamond film grown by CVD technique Images show information on crystal shape, orientation, stresses and defect densities Map area: 175 µm x 88 µm Spectra generated: 51,200 Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image) Image 1: Raman image showing 1 cm-1 variation in position of the 1332 cm-1 diamond band Image 2: Raman image showing 2 cm-1 variation in width of the 1332 cm-1 diamond band Image 3: Raman image showing variation in peak area of the 1332 cm-1 diamond band Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]0 band | |
Micro indentation in silicon wafer | ||
 | Peak position Peak position derived from curve-fit analysis Map area: 10 µm x 10 µm Spectra generated: 10,000 Acquisition time: 36 minutes (single acquisition analysed for both images) Scan details: 100 nm step achieved using piezoelectic scanning stage | |
 | Peak width Peak width derived from curve-fit analysis | |
Sandstone from Loch Torridon, Scotland | ||
 | StreamLine™ Plus image showing the distribution of Anatase (TiO2) (red), Quartz (SiO2) (green) and Haematite (Fe2O3) (blue) Area of section: 500 µm x 320 µm Spectra generated: 67,200 Acquisition time: 20 minutes | |
Polymer laminate (PS and PMMA) | ||
 | StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), Epoxy (green) and PS (blue) Map area: 240 µm x 645 µm Spectra generated: 17,200 Acquisition time: 7 minutes | |
Strained S-Ge cross-hatch | ||
 | StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm-1 bａnd position (~0.2 cm-1 positional bａnd shift). The map data was generated using curve fitting. Map area: 129µm x 130µm Spectra generated: 55,000 Acquisition time: 13 minutes | |
Tooth section | ||
 | StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red) Map area: 9mm x 16mm Spectra generated: 84,000 Acquisition time: 20 minutes | |
| Multilayred graphene sample | ||
Laser induced crystalline silicon tracks | ||
 | StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate Map area: 550µm x 550µm Spectra generated: 70,000 Acquisition time: 17 minutes | |
 | Zoomed region (~ 250µm x 250µm) of above image | |
浙江精科计量仪器有限公司是一家专业从事计量器具、仪器仪表、检测设备的销售、维修、计量于一体的商贸公司。主要产品有三坐标、光谱仪、齿轮测量中心、激光干涉仪、柔性测量臂、激光跟踪仪、无损探伤检测、圆度仪圆柱度仪、轮廓仪、粗糙度仪、材料试验、金相系统、环境试验等精密量仪，应用于工业制造，院校教学，质量监督，科技科研等相关领域。 精科公司自成立以来，先后在浙江区域的台州、杭州、宁波、永康、温州设立了分公司及办事处，为客户满意而服务。精科公司站在用户角度以企业的“节约成本，提高质量，科学管理”为导向，担负着各行业“质量求发展”的使命，始终秉承“诚信为根，服务为本”的经营理念，在用户朋友及协作单位中有良好的信誉，在行业内较有影响力。现已成为计量检测仪器行业的熟知品牌。精科公司正迅猛发展，继续本着“精益求精，全心全意”的服务精神，为中国工业发展和品牌提升，做出更大的贡献。
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拉曼光谱仪 产品信息
